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Probe access
A nominally clear measured feature may be inaccessible along the probe approach or withdrawal path. Include the whole inspection movement.
This reference collection concerns light, offline dimensional-inspection layouts. It brings locating concepts, component descriptions and revision records together without substituting for an engineered fixture design. The drawings are original explanatory diagrams. Reference IDs identify documents, not commercially tested products. Read the scope and limitations alongside each example, and keep the actual part drawing and inspection requirements available when reviewing a proposed layout.
Practical example
Draw the approach envelope as a separate translucent region around the target feature.
A static sketch does not prove collision-free operation on a particular machine.